Skip to main content

Nanomechanical Test Instrument

Nanotechnology Research Facility
Equipment
Nanomechanical Test Instrument

Specifications

  • Hysitron (Model Ti -- 700Ubi).
  • Testing mode: Quasi-static indentation.
  • Transducer: - Load: ≤ 10mN (resolution: 1 nN). - Displacement: ≤ 5µm (resolution: 0.0004 nm).
  • In-situ SPM imaging.
  • X-Y scan area: up to 60 µm x 60 µm.

Principles

The nanoindenter is used for providing quantitative nanomechanical characterization of small volumes of material. Nanoindentation test is driven by a transducer used to apply an increasing load to some a preset value, allowing the indenter to penetrate the sample surface. The indenter usually has a tip of known geometry to allow determining the indentation area. Berkovich tip is commonly used that has a three-sided pyramid geometry. The amount of load and size of the indenter tip are very small, so the indentation area may range between several square nanometers to few micrometers. The load and depth of penetration are recorded continuously throughout this process to produce a load-displacement curve, from which mechanical properties such as elastic modulus and hardness are determined.

Capabilities

  • Automated testing using capacitive transducer for sensitivity and stability.
  • In-situ scanning probe microscopy (SPM) imaging provides nanometer precision positioning.
  • Different indenter-tip geometries (Berkovich, Vickers, sphero-conical, knoop, cube-corner).
  • Top-down optics for viewing and selection of testing sites.
  • Sub-micron resolution staging for sample positioning.
  • Environmental isolation & active vibration dampening system for low noise & high sensitivity.

Applications