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Sequential Wavelength Dispersive X-ray Fluorescence (WDXRF)

Nanotechnology Research Facility
Equipment
Sequential Wavelength Dispersive X-Ray

Specifications

  • 4kW (60 kV, 150 mA) X-ray tube with 30 micron Be end-window.
  • Scanning speed 2400˚/ min at maximum (2θ)
  • Auto sampler: 48 samples.
  • Detectors (SC and F-PC, S-PC LE), Angular range: SC: 5-118°, F-PC: 13-148°.
  • Continuous scan: From 0.1 - 240°/min.
  • Sample size: up to 51 mm (diameter) by 30 mm (high).
  • Quantitative analysis, Mapping and CCD sample observation, Ref stds, analysis kit.
  • Micro mapping: Sample image and data display.

Principles

The Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types (solids, liquids, powders, alloys, and thin films) with minimal standards.

Capabilities

  • Analysis of elements from Be to U.
  • Tube above optics minimizes contamination issues.
  • Micro analysis to analyze samples as small as 500 µm.
  • 30μ tube delivers superior light element performance.
  • Mapping feature for elemental topography/distribution.
  • Helium seal means the optics are always under vacuum.

Applications

  • Materials science.
  • Petroleum & petrochemicals.
  • Cement.
  • Coatings.
  • Environmental.
  • Food & food ingredients.
  • Geology & minerals.
  • Pharmaceuticals.
  • Polymers.