The course encompasses the theoretical and practical aspects of digital systems testing and the design of easily testable circuits. Major topics include defect, fault modeling, test generation for combinational and sequential circuits, test measures and costs, functional and parametric test methods, single stuck-at model, design for testability, scan-path design, built-in self-tests, and concurrent testing. In addition, the course introduces students to ATPG tools and their usage in fault simulation, test, and diagnosis of combinational circuits.